A Armigliato : rechercher sur Z-Library

Journal of Applied Physics

Année:

1994

Langue:

english

Fichier:

PDF, 1.01 MB

english, 1994

Effect of nitrogen implantation at the SiO[sub 2]/SiC interface on the electron mobility and free carrier density in 4H-SiC metal oxide semiconductor field effect transistor channel

Poggi, A., Moscatelli, F., Solmi, S., Armigliato, A., Belsito, L., Nipoti, R.

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 645 KB

english, 2010

Preparation and characterization of Au-SiO2 radio frequency co-sputtered thin films

A. Armigliato, G.G. Bentini, S. Guerri, P. Ostoja, L. Morettini

Journal:

Année:

1976

Langue:

english

Fichier:

PDF, 2.64 MB

english, 1976

Characterization of titanium nitride films deposited onto silicon

A. Armigliato, G. Celotti, A. Garulli, S. Guerri, P. Ostoja, R. Rosa, G. Martinelli

Journal:

Année:

1982

Langue:

english

Fichier:

PDF, 1.49 MB

english, 1982

Ion-implanted TiN films as diffusion barriers in silicon device technology

A. Armigliato, M. Finetti, A. Garulli, S. Guerri, R. Lotti, P. Ostoja

Journal:

Année:

1985

Langue:

english

Fichier:

PDF, 599 KB

english, 1985

Electron microscopy observations of N2+ -implanted TiN films as diffusion barriers for very-large-scale integration applications

A. Armigliato, M. Finetti, S. Guerri, P. Ostoja, A. Scorzoni, J. Garrido

Journal:

Applied Catalysis A: General

Année:

1986

Langue:

english

Fichier:

PDF, 397 KB

english, 1986

On the assessment of local stress distributions in integrated circuits

J. Vanhellemont, I. De Wolf, K.G.F. Janssens, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Applied Surface Science

Année:

1993

Langue:

english

Fichier:

PDF, 573 KB

english, 1993

Synthesis of MMoO4/SiO2 catalysts (M=Ni or Co) by a sol–gel route via silicon alkoxides: Stabilization of β-NiMoO4 at room temperature

D Cauzzi, M Deltratti, G Predieri, A Tiripicchio, A Kaddouri, C Mazzocchia, E Tempesti, A Armigliato, C Vignali

Journal:

Année:

1999

Langue:

english

Fichier:

PDF, 471 KB

english, 1999

Low temperature dopant activation of BF2implanted silicon

G. Queirolo, C. Bresolin, D. Robba, M. Anderle, R. Canteri, A. Armigliato, G. Ottaviani, S. Frabboni

Journal:

Journal of Electronic Materials

Année:

1991

Langue:

english

Fichier:

PDF, 1.12 MB

english, 1991

Identification of the source fault of the 1908 Messina earthquake through tsunami modelling. Is it a possible task?

S. Tinti, A. Armigliato, E. Bortolucci, A. Piatanesi

Journal:

Physics and Chemistry of the Earth, Part B: Hydrology, Oceans and Atmosphere

Année:

1999

Langue:

english

Fichier:

PDF, 573 KB

english, 1999

Dopant and carrier concentration in Si in equilibrium with monoclinic SiP precipitates

Solmi, S., Parisini, A., Angelucci, R., Armigliato, A., Nobili, D., Moro, L.

Journal:

Année:

1996

Langue:

english

Fichier:

PDF, 674 KB

english, 1996

heavily implanted silicon

Allain, J. L., Regnard, J. R., Bourret, A., Parisini, A., Armigliato, A., Tourillon, G., Pizzini, S.

Journal:

Année:

1992

Langue:

english

Fichier:

PDF, 527 KB

english, 1992

Anomalous low-temperature dopant diffusivity and defect structure in Sb- and Sb/B-implanted annealed silicon samples

Armigliato, A., Romanato, F., Drigo, A., Carnera, A., Brizard, C., Regnard, J. R., Allain, J. L.

Journal:

Biasotto, C., Isoda, Luiz B., Franco, Cibele S., Armigliato, Nelson

Année:

1995

Langue:

english

Fichier:

PDF, 1.58 MB

english, 1995

ECS Transactions [ECS 26th Symposium on Microelectronics Technology and Devices (SBMicro 2011) - Joao Pessoa, Brazil (August 30 - September 2, 2011)] - Evaluation of Low Cost Metallization Process for Power Electronic Modules by Wire Wedge Bond Process on Nickel/Copper and Nickel/Copper/Silver Pads

Année:

2011

Langue:

english

Fichier:

PDF, 346 KB

english, 2011

Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Année:

1995

Langue:

english

Fichier:

PDF, 3.21 MB

english, 1995

Transmission Electron Diffraction Techniques for Nm Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Année:

1995

Langue:

english

Fichier:

PDF, 3.32 MB

english, 1995

A numerical investigation of the 1783 landslide-induced catastrophic tsunami in Scilla, Italy

Filippo, Zaniboni, Alberto, Armigliato, Stefano, Tinti

Journal:

Natural Hazards

Année:

2016

Langue:

english

Fichier:

PDF, 6.71 MB

english, 2016

Assessment of the 1783 Scilla landslide–tsunami's effects on the Calabrian and Sicilian coasts through numerical modeling

Zaniboni, Filippo, Pagnoni, Gianluca, Gallotti, Glauco, Paparo, Maria Ausilia, Armigliato, Alberto, Tinti, Stefano

Journal:

Natural Hazards and Earth System Science

Année:

2019

Langue:

english

Fichier:

PDF, 19.16 MB

english, 2019

The Large Earthquake (~ M7) and Its Associated Tsunami of 8 November 1905 in Mt. Athos, Northern Greece

Triantafyllou, Ι., Zaniboni, F., Armigliato, A., Tinti, S., Papadopoulos, G. A.

Journal:

Pure and Applied Geophysics

Année:

2019

Langue:

english

Fichier:

PDF, 5.25 MB

english, 2019

Relationships between radial atomic distribution curves and the mechanism for the paracrystal-crystal transition of isotactic polypropylene

R. Zannetti, G. Celotti, A. Armigliato

Journal:

European Polymer Journal

Année:

1970

Langue:

english

Fichier:

PDF, 526 KB

english, 1970

Analysis of boron predeposited silicon wafers by combined ion beam techniques and X-ray microanalysis

A. Armigliato, G.G. Bentini, G. Ruffini, G. Battaglin, G. Della Mea, A.V. Drigo

Journal:

Nuclear Instruments and Methods

Année:

1978

Langue:

english

Fichier:

PDF, 494 KB

english, 1978

Oxygen and implanted ion profiles in oxidized zirconium

M. Berti, A. Carnera, A.V. Drigo, A. Armigliato, A. Desalvo, R. Rosa

Journal:

Nuclear Instruments and Methods

Année:

1981

Langue:

english

Fichier:

PDF, 555 KB

english, 1981

Arsenic ion implantation through Mo and Mo silicide layers for shallow junction formation

R. Angelucci, S. Solmi, A. Armigliato, E. Gabilli, D. Govoni, M. Merli, A. Poggi

Journal:

Solid-State Electronics

Année:

1992

Langue:

english

Fichier:

PDF, 1.38 MB

english, 1992

Round robin investigation of silicon oxide on silicon reference materials for ellipsometry

J. Vanhellemont, H.E. Maes, M. Schaekers, A. Armigliato, H. Cerva, A. Cullis, J. de Sande, H. Dinges, J. Hallais, V. Nayar, C. Pickering, J.-L. Stehlé, J. Van Landuyt, C. Walker, H. Werner, P. Salieri

Journal:

Applied Surface Science

Année:

1993

Langue:

english

Fichier:

PDF, 591 KB

english, 1993

A color video presentation of simulated high resolution lattice images

P. Venturi, A. Armigliato, A.M. Mazzone, D. Govoni

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 170 KB

english, 1984

Preparation of silicon cross-sectional specimens for TEM observation

A. Garulli, M. Vanzi, M. Giannini, A. Armigliato

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 95 KB

english, 1984

A computer programme for an automated electron microprobe to solve X-ray interferences

A. Armigliato, A. Garulli, D. Gavoni, P. Venturi

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 87 KB

english, 1984

High resolution electron microscopy observations of precipitates in p-supersaturated silicon

A. Armigliato, P. Werner

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 1.76 MB

english, 1984

A preparation technique for TEM cross-sections of test structures with reduced feature size

A. Garulli, A. Armigliato, M. Finetti

Journal:

Année:

1988

Langue:

english

Fichier:

PDF, 1.10 MB

english, 1988

Simultaneous determination of composition and thickness of thin films by x-ray microanalysis at 300 kV and Monte Carlo simulation

A. Armigliato, R. Rosa

Journal:

Superlattices and Microstructures

Année:

1990

Langue:

english

Fichier:

PDF, 764 KB

english, 1990

Characterization of TiOx films and their application as antireflection coatings for silicon solar cells

A. Armigliato, G. Celotti, S. Guerri, P. Ostoja, R. Rosa, G. Martinelli

Journal:

Solar Cells

Année:

1981

Langue:

english

Fichier:

PDF, 1004 KB

english, 1981

Analysis of crystal defects by transmission electron microscopy

A. Armigliato

Journal:

Materials Chemistry

Année:

1979

Langue:

english

Fichier:

PDF, 1.34 MB

english, 1979

Investigation of amorphous a-Si:H/a-Si1−xCx:H multi-quantum-well structures

M. De Seta, P. Fiorini, F. Evangelisti, A. Armigliato

Journal:

Année:

1989

Langue:

english

Fichier:

PDF, 354 KB

english, 1989

Depth profiles and damage annealing of 1.06 MeV As2+ Implanted in silicon

A. Armigliato, R. Nipoti, G.G. Bentini, A.M. Mazzone, M. Bianconi, A. Nylandsted Larsen, A. Gasparotto

Journal:

Materials Science and Engineering: B

Année:

1989

Langue:

english

Fichier:

PDF, 379 KB

english, 1989

Recent findings in silicon doping with phosphorous

D. Nobili, S. Solmi, A. Parisini, A. Armigliato, L. Moro

Journal:

Renewable Energy

Année:

1994

Langue:

english

Fichier:

PDF, 82 KB

english, 1994

The generating mechanisms of the August 17, 1999 İzmit bay (Turkey) tsunami: Regional (tectonic) and local (mass instabilities) causes

Stefano Tinti, Alberto Armigliato, Anna Manucci, Gianluca Pagnoni, Filippo Zaniboni, Ahmet Cevdet Yalçiner, Yildiz Altinok

Journal:

Marine Geology

Année:

2006

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2006

Damage and recovery in doped SOI layers after high energy implantation

M. Ferri, S. Solmi, A. Armigliato, M. Bianconi, G. Lulli, D. Nobili

Journal:

Materials Science and Engineering: B

Année:

2004

Langue:

english

Fichier:

PDF, 256 KB

english, 2004

Strain field reconstruction in shallow trench isolation structures by CBED and LACBED

A. Spessot, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2006

Langue:

english

Fichier:

PDF, 745 KB

english, 2006

Boron nitride thin films deposited by RF plasma reactive pulsed laser ablation as interlayer between WC–Co hard metals and CVD diamond films

E Cappelli, S Orlando, G Mattei, A Armigliato

Journal:

Surface and Coatings Technology

Année:

2004

Langue:

english

Fichier:

PDF, 990 KB

english, 2004

The use of scenarios to evaluate the tsunami impact in southern Italy

Stefano Tinti, Alberto Armigliato

Journal:

Marine Geology

Année:

2003

Langue:

english

Fichier:

PDF, 1.31 MB

english, 2003

Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling

I De Wolf, V Senez, R Balboni, A Armigliato, S Frabboni, A Cedola, S Lagomarsino

Journal:

Microelectronic Engineering

Année:

2003

Langue:

english

Fichier:

PDF, 782 KB

english, 2003

Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED

A. Benedetti, A.G. Cullis, A. Armigliato, R. Balboni, S. Frabboni, G.F. Mastracchio, G. Pavia

Journal:

Applied Surface Science

Année:

2002

Langue:

english

Fichier:

PDF, 173 KB

english, 2002

Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns

Feng Wu, Aldo Armigliato, Roberto Balboni, Stefano Frabboni

Journal: